Specifications: The setup involves a Model 4275A multi-frequency LCR meter, a Model 617 programmable electrometer and a microcomputer with an IEEE interface card for automated measurements. The low temperature measurement is possible in two ways:

1. A micro-manipulator probe system with a J-T (Joule-Thomson) cooler and a K-20 temperature controller from MMR, Inc., allows precise positioning of microprobes on the device under test. While the J-T can be cooled with dry nitrogen gas, the temperature can be controlled precisely between 300 K and 78 K using K-20.
2. The HDL-5 series liquid helium dewar from Infrared Laboratories, Inc. has the provision to measure the characteristics of bonded devices and arrays. It has a 5" (12.7 cm) cold plate with a LCC (leadless chip carrier) for array mounting, a radiation shield maintained at the same temperature as that of the device under test, and a Lakeshore Model 330 temperature controller which can help maintain the temperature between 300 K and 4 K.