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Research Facility
Opus MBE system



Function: The Opus 45 Molecular Beam Epitaxy (MBE) system consists of three interconnected chambers:OPUS MBE system- Click to enlarge
  • a growth chamber
  • a preparation chamber
  • a loading/ unloading chamber
The manipulators can accommodate wafers of up to five inches (12.7 cm) in diameter. The wafers can be kept in a horizontal face-down position during all steps.

The Opus 45 is one of four Molecular Beam Epitaxy (MBE) chambers at the MPL.

Research: This unit is primarily used to study the growth of CdTe and CdZnTe on Si.


Specifications: The chambers have the following statistics:
Chamber Vacuumed by Pressure
Growth Two high-capacity cryopumps Typical:
low 10-10 torr
Preparation Large-capacity ion pump Basic:
low 10-10 torr
Loading/unloading Large-capacity ion pump Basic:
high 10-10 torr

The manipulators in the growth and preparation chambers can accommodate either:
  • One wafer, up to five inches (12.7 cm) in diameter, or
  • Three wafers, up to two inches (5.08 cm) in diameter.
The wafer(s) is/are mounted, indium-free, on a platen five inches in diameter. (The platen may be omitted if the wafer is a full five inches in diameter.) The growth chamber can accommodate eight material cells, each of which faces the wafer(s) at a 45o angle. The material cells are evenly distributed around the chamber. The large capacity (100 cc) cell has a specific design with a two-filament heating stage which is very useful for Te compounds. Great effort has been made in the design of the heating stages in both the growth and preparation chambers to achieve high temperature uniformity (+/- 1.5oC over a wafer two inches in diameter.) The Opus 45, which is equipped with a reflection high energy electron diffraction (RHEED) unit, has been found to be almost ideal for the growth of highly uniform CdTe layers on GaAs and Si.



Facilities

Laboratory Equipment List:


Materials Growth

 Opus 45 MBE system
 MBE Cluster Tool system
 Riber-32 MBE system
 Riber-EPI MBE system

Materials Characterization

 Scanning Electron Microscope
 Hall measurement system
 Ellipsometry System
 The Auger System
 Vacuum Electro-Reflectance
 Photoluminescence
 Other Equipments

Device

 Device Fabrication
 Mask Aligner
 Photoresist Spinner
 Evaporation Systems
 Bonder
 I-V, C-V Setup
 Spectral Response

© 2000
Microphysics Laboratory
University of Illinois at Chicago