An X-ray double crystal diffractometry machine is primarily used to measure the FWHM of the DCRC which determines the crystalinity of MBE grown films. Also available is an X-ray topography machine for the structural defects and strain effects in substrates and MBE films.

Electrical Characterization

The electrical characterization equipment at UIC includes:

• a programmable electrometer,
• a multi-frequency LCR meter,
• a low temperature probe station,
• and a temperature controller.

Transport measurements of semi-metals and wide gap semi-insulating semiconductors can be performed with or without magnetic fields. This facility can measure up to three samples per run and can take them to a temperature as low as 4.2K. Some characteristics that are measured are:

• majority carrier information,
• multi-band effects,
• and photo-hall.

Lifetime Measurement

The photoconductive lifetime measurement facility at MPL consists of:

• a pulsed GaAlAs laser,
• a liquid nitrogen cryostat,
• a pre-amplifier,
• and a digitizing oscilloscope.